Olympus Microscope MX51

Service Line: 04 Imaging and Characterization

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The Olympus MX51 industrial inspection microscope is optimized for the inspection requirements of a variety of electronic components including semiconductor wafer inspection. Its compact size, ease of operation, 6″x6″ stage travel and cost effectiveness make the MX51 an ideal inspection microscope offering superb versatility.

The MX51 offers all of the highest performing imaging techniques for fast efficient inspection including Brightfield, Darkfield, DIC (Nomarski), IR and DUV.

Analysis Five Software, the latest version of comprehensive image analysis software based on the analySIS® platform, is used with both our Olympus MX51 Microscopes.

Manufacturer: Olympus
Model: MX51
Qty scopes on hand: 2

VASE Research Spectroscopic Ellipsometer with AnalySIS Five Software
VASE Research Spectroscopic Ellipsometer with AnalySIS Five Software

Contact:
Scott Williams
704-687-8126​
scotwill@charlotte.edu

Tool Location:

Grigg Hall, Third Floor Room: CleanRoom Bay Number: 3